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Publication search results
found 15 matches
- 2017
- Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada:
Embedded Deterministic Test Points. IEEE Trans. Very Large Scale Integr. Syst. 25(10): 2949-2961 (2017) - 2015
- Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada:
Embedded deterministic test points for compact cell-aware tests. ITC 2015: 1-8 - 2014
- Maciej Trawka, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jakub Janicki, Jerzy Tyszer:
High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs. ATS 2014: 74-80 - 2008
- Adam B. Kinsman, Nicola Nicolici:
Embedded Deterministic Test Exploiting Care Bit Clustering and Seed Borrowing. ISQED 2008: 832-837 - 2007
- Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low Power Embedded Deterministic Test. VTS 2007: 75-83 - 2005
- Maciej Bellos, Dimitris Nikolos:
Deterministic Test Vector Compression / Decompression Using an Embedded Processor. EDCC 2005: 318-331 - 2004
- Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee:
Embedded deterministic test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(5): 776-792 (2004) - 2003
- Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian:
Embedded Deterministic Test for Low-Cost Manufacturing. IEEE Des. Test Comput. 20(5): 58-66 (2003) - Adam B. Kinsman, Jonathan I. Hewitt, Nicola Nicolici:
Embedded Compact Deterministic Test for IP-Protected Cores. DFT 2003: 519- - 2002
- Abhijit Jas, Nur A. Touba:
Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor. J. Electron. Test. 18(4-5): 503-514 (2002) - Lars Schäfer, Rainer Dorsch, Hans-Joachim Wunderlich:
RESPIN++ - deterministic embedded test. ETW 2002: 37-44 - Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian:
Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310 - 2001
- Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Mihalis Psarakis, Yervant Zorian:
Deterministic software-based self-testing of embedded processor cores. DATE 2001: 92-96 - 1999
- Abhijit Jas, Nur A. Touba:
Using an Embedded Processor for Efficient Deterministic Testing of Systems-on-a-Chip. ICCD 1999: 418- - 1995
- Luigi Ternullo Jr., R. Dean Adams, John Connor, Garret S. Koch:
Deterministic Self-Test of a High-Speed Embedded Memory and Logic Processor Subsystem. ITC 1995: 33-44
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